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VERSION:2.0
PRODID:-//ESREF2026//Conference Program//EN
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BEGIN:VEVENT
UID:Talk A-1-1
DTSTART;TZID=Europe/Vienna:20260922T160000
DTEND;TZID=Europe/Vienna:20260922T162000
SUMMARY:Coupling On-Chip Sensor with a Control and Repair Strategy to Monit
 or Memory Aging Evolution
LOCATION:Villach Room (EI8)
DESCRIPTION:Authors: Fabian Vargas, Vache Galstyan, Gurgen Harutyunyan, Yer
 vant Zorian\nAffiliation: IHP - Leibniz Institute for High Performance Mic
 roelectronics, Germany; Synopsys, Armenia; Synopsys, United States\n
CATEGORIES:A-1: Quality and Reliability Assessment Techniques and Methods f
 or Devices and Systems
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