Document

Time

Vienna (EI7)

Villach (EI8)

Graz (EI9)

Linz (EI10)

Expo

08:00

- 08:20

08:20

- 08:40

08:40

- 09:00

09:00

- 09:20

(KEY-2) Keynote II
Ben Kaczer

Exhibition

09:20

- 09:40

09:40

- 10:00

10:00

- 10:20

Coffee break

10:20

- 10:40

Session F2-2: Power Devices
Reliability: Wide-Bandgap
Devices

Session E-1: Packaging- and
Assembly Reliability and
Failure Analysis

(INV-5) Invited Talk
Michael Rogers

10:40

- 11:00

11:00

- 11:20

Session G: Photonics
Reliability

11:20

- 11:40

Industrial Session

11:40

- 12:00

12:00

- 12:20

12:20

- 12:40

Lunch Break

12:40

- 13:00

13:00

- 13:20

13:20

- 13:40

Session F2-3: Power Devices
Reliability: Wide-Bandgap
Devices

Industrial Session

(INV-6) Invited Talk
Francesco Iannuzzo

Session H: MEMS and
Sensor Reliability

13:40

- 14:00

14:00

- 14:20

Session E-2: Packaging- and
Assembly Reliability and
Failure Analysis

14:20

- 14:40

14:40

- 15:00

15:00

- 15:20

15:20

- 15:40

Coffee break

15:40

- 16:00

16:00

- 16:20

Session F1: Power Devices
Reliability: Smart-Power
Devices and Silicon Power
Devices

Industrial Session

(INV-7) Best Paper ISFTA25

16:20

- 16:40

Session C-2: Progress in
Failure Analysis: Defect
Detection and Analysis

16:40

- 17:00

Session A-2: Quality and
Reliability Assessment
Techniques and Methods
for Devices and Systems

17:00

- 17:20

17:20

- 17:40

17:40

- 18:00

18:00

- 18:20

18:20

- 18:40

18:40

- 19:00

19:00

- 19:20

Gala Dinner
Main Hall Vienna

19:20

- 19:40

19:40

- 20:00

20:00

- 20:20

20:20

- 20:40

20:40

- 21:00

21:00

- 21:20

21:20

- 21:40

21:40

- 22:00