2026 VIENNA ESREF
Tuesday, 22. September 2026 · TU Wien
Vienna · Villach · Graz · Linz
Time
Vienna (EI7)
Villach (EI8)
Graz (EI9)
Linz (EI10)
Expo
08:00
- 08:20
08:20
- 08:40
Registration desk opens
08:40
- 09:00
09:00
- 09:20
Opening session
Exhibition
09:20
- 09:40
09:40
- 10:00
(KEY-1) Keynote I
Gerald Deboy
10:00
- 10:20
10:20
- 10:40
10:40
- 11:00
Coffee break
11:00
- 11:20
(INV-1) Invited Talk
Stefano Aresu
(INV-2) Invited Talk
Cezar Zota
11:20
- 11:40
11:40
- 12:00
Session F2-1: Power Devices Reliability:
Wide-Bandgap Devices
Session B-1: Reliability for
Nanoelectronics
12:00
- 12:20
12:20
- 12:40
Lunch Break
12:40
- 13:00
13:00
- 13:20
13:20
- 13:40
Session F2-1: Power Devices
Reliability: Wide-Bandgap
Devices
(INV-3) Invited Talk
Wenzel Prochazka
Session B-1: Reliability for
Nanoelectronics
13:40
- 14:00
Session B-2: Reliability for
Nanoelectronics
14:00
- 14:20
Session J: Automotive and
Industrial Electronic Reliability
14:20
- 14:40
14:40
- 15:00
15:00
- 15:20
Coffee break
15:20
- 15:40
15:40
- 16:00
Session F3: Power Devices
Reliability: Power Electronic
Systems
(INV-4) Best Paper IPFA26
Session B-2: Reliability for
Nanoelectronics
16:00
- 16:20
Session A-1: Quality and
Reliability Assessment
Techniques and Methods
for Devices and Systems
16:20
- 16:40
16:40
- 17:00
Session C-1: Progress in
Failure Analysis: Defect
Detection and Analysis
17:00
- 17:20
17:20
- 17:40
17:40
- 18:00
18:00
- 18:20
Poster Session
Conference Venue
18:20
- 18:40
18:40
- 19:00
19:00
- 19:20
19:20
- 19:40
19:40
- 20:00
20:00
- 20:20
20:20
- 20:40
20:40
- 21:00